The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Jun. 18, 2014
Applicant:

Samsung Electronics Co., Ltd., Suwon-si, KR;

Inventors:

Baek-Hwan Cho, Seoul, KR;

Yeong-Kyeong Seong, Yongin-si, KR;

Ye-Hoon Kim, Seoul, KR;

Jung-Hoe Kim, Seongnam-si, KR;

Moon-Ho Park, Hwaseong-si, KR;

Sin-Sang Yu, Seoul, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06T 2207/10072 (2013.01); G06T 2207/10116 (2013.01); G06T 2207/10132 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/30096 (2013.01);
Abstract

An apparatus and method for detecting a lesion, which enables to adaptively determine a parameter value of a lesion detection process using a feature value extracted from a received medical image and a parameter prediction model to improve accuracy in lesion detection and lesion diagnosis. The apparatus and the method include a model generator configured to generate a parameter prediction model based on pre-collected medical images, an extractor configured to extract a feature value from a received medical image, and a determiner configured to determine a parameter value of a lesion detection process using the extracted feature value and the parameter prediction model.


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