The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Apr. 24, 2014
General Electric Company, Schenectady, NY (US);
Ser Nam Lim, Niskayuna, NY (US);
Jose Abiel Garza, McAllen, TX (US);
David Scott Diwinsky, Cincinnati, OH (US);
Li Guan, Clifton Park, NY (US);
Shubao Liu, Niskayuna, NY (US);
Xingwei Yang, Bellevue, WA (US);
Jens Rittscher, Ballston Lake, NY (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method for image based inspection of an object includes receiving an image of an object from an image capture device, wherein the image includes a representation of the object with mil-level precision. The method further includes projecting a measurement feature of the object from the image onto a three-dimensional (3D) model of the object based on a final projection matrix; determining a difference between the projected measurement feature and an existing measurement feature on the 3D model; and sending a notification including the difference between the projected measurement feature and the existing measurement feature.