The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Sep. 29, 2014
Applicants:

Samsung Electronics Co., Ltd., Suwon-si, Gyeonggi-do, KR;

Seoul National University R&db Foundation, Seoul, KR;

Inventors:

Mu-sik Kwon, Seoul, KR;

Nam-ik Cho, Seoul, KR;

Sang-ho Kim, Hwaseong-si, KR;

Beom-su Kim, Seoul, KR;

Won-kyo Seo, Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G06K 9/66 (2006.01); G06K 9/00 (2006.01); G06T 5/00 (2006.01); G06T 3/00 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
G06K 9/00442 (2013.01); G06T 3/0031 (2013.01); G06T 5/006 (2013.01); G06K 2009/363 (2013.01);
Abstract

A method and apparatus for generating a dewarped document using a document image captured using a camera are provided. The method includes obtaining the document image captures using the camera, extracting text lines from the document image captured using the camera, determining a projection formula to convert positions of respective points constituting the extracted text lines to coordinates projected on a plane of the dewarped document, determining a target function used to calculate a difference between text lines projected on the place of the dewarped document using the projection formula and real text lines, calculating parameters that minimize the target function, and converting the document image to the dewarped document by substituting the calculated parameters into the projection formula.


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