The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Mar. 21, 2014
Applicant:

Netapp Inc., Sunnyvale, CA (US);

Inventors:

Edward Barron, Pepperell, MA (US);

Loellyn Cassell, Pleasanton, CA (US);

John DeGraaf, Cranberry Township, PA (US);

Assignee:

NetApp Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01); G06F 3/06 (2006.01); H04L 12/26 (2006.01); H04L 12/24 (2006.01);
U.S. Cl.
CPC ...
G06F 17/30112 (2013.01); G06F 3/0605 (2013.01); G06F 3/067 (2013.01); G06F 3/0653 (2013.01); G06F 17/302 (2013.01); H04L 41/0893 (2013.01); H04L 43/0817 (2013.01); G06F 2206/1008 (2013.01); H04L 41/069 (2013.01); H04L 41/0853 (2013.01); H04L 41/12 (2013.01);
Abstract

One or more techniques and/or systems are provided for generating a macroscopic cluster view of storage devices, as opposed to merely an isolated view from an individual node. For example, nodes within a node cluster may be queried for storage device reports comprising storage device information regarding storage devices with which the nodes are respectively connected (e.g., I/O performance statistics, path connections, storage device attributes, status, error history, etc.). The storage device reports may be aggregated together to define one or more storage device data structures (e.g., a storage device data structure comprising one or more tables that may be populated with storage device information). In this way, the cluster view may be generated based upon querying one or more storage device data structures (e.g., an error cluster view, a storage device cluster view, a node summary cluster view, etc.).


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