The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Jan. 24, 2014
Applicant:

Netapp, Inc., Sunnyvale, CA (US);

Inventors:

Greg William Achilles, Denver, CO (US);

Gordon Hulpieu, Boulder, CO (US);

Donald Roman Humlicek, Wichita, KS (US);

Martin Oree Parrish, Boulder, CO (US);

Kent Prosch, Boulder, CO (US);

Alan Stewart, Frisco, CO (US);

Assignee:

NetApp Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/08 (2006.01); G06F 11/14 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0891 (2013.01); G06F 12/0815 (2013.01); G06F 11/1471 (2013.01); G06F 12/0873 (2013.01);
Abstract

Atomic write operations for storage devices are implemented by maintaining the data that would be overwritten in the cache until the write operation completes. After the write operation completes, including generating any related metadata, a checkpoint is created. After the checkpoint is created, the old data is discarded and the new data becomes the current data for the affected storage locations. If an interruption occurs prior to the creation of the checkpoint, the old data is recovered and any new is discarded. If an interruption occurs after the creation of the checkpoint, any remaining old data is discarded and the new data becomes the current data. Write logs that indicate the locations affected by in progress write operation are used in some implementations. If neither all of the new data nor all of the old data is recoverable, a predetermined pattern can be written into the affected locations.


Find Patent Forward Citations

Loading…