The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Aug. 24, 2015
The Mathworks, Inc., Natick, MA (US);
Arwen M. Warlock, Waltham, MA (US);
Biao Yu, Sharon, MA (US);
Matthew J. Englehart, Olmsted Township, OH (US);
Peter S. Szpak, Newton, MA (US);
Murali K. Yeddanapudi, Lexington, MA (US);
Yuan Cao, Holliston, MA (US);
The MathWorks, Inc., Natick, MA (US);
Abstract
A device may receive a model including a group of blocks, and may receive a command to execute the model. The device may assign a parameter sample time to a subset of blocks of the group of blocks. The parameter sample time may permit a block, of the subset of blocks, to be executed based on a parameter change event detected during the execution of the model. The device may cause the model to be executed after assigning the parameter sample time to the subset of blocks. The device may detect a parameter change event, associated with the model, prior to the execution of the model being completed. The parameter change event may include an event that is external to the execution of the model. The device may cause at least one block, of the subset of blocks, to be executed based on the detecting the parameter change event.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile