The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Jun. 13, 2013
Amazon Technologies, Inc., Reno, NV (US);
Jai Vasanth, Seattle, WA (US);
Barry Bailey Hunter, Jr., Sammamish, WA (US);
Kiran-Kumar Muniswamy-Reddy, Seattle, WA (US);
David Alan Lutz, Renton, WA (US);
Jian Wang, Bellevue, WA (US);
Maximiliano MacCanti, Bellevue, WA (US);
Amazon Technologies, Inc., Reno, NV (US);
Abstract
Detecting replica faults within a replica group and dynamically scheduling replica healing operations are described. Status metadata for one or more replica groups may be accessed. Based, at least in part, the status data a number of available replicas for at least one replica group may be determined to incompliant with a healthy state definition for the replica group. One or more healing operations to restore the number of available replicas for the at least one replica group to the respective healthy state definition may be dynamically scheduled. In some embodiments, one or more resource constraints for performing healing operations and one or more resource requirements for each of the one or more healing operations may be used to order the one or more healing operations.