The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

May. 27, 2011
Applicant:

Takahiro Masumura, Tucson, AZ (US);

Inventor:

Takahiro Masumura, Tucson, AZ (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01); G03H 1/04 (2006.01); G11B 7/0065 (2006.01); G01N 21/47 (2006.01); G03H 1/00 (2006.01); G01N 21/17 (2006.01);
U.S. Cl.
CPC ...
G03H 1/0465 (2013.01); G01N 21/4795 (2013.01); G11B 7/0065 (2013.01); G01N 2021/1706 (2013.01); G03H 2001/0072 (2013.01); G03H 2001/0083 (2013.01); G11B 2220/2504 (2013.01);
Abstract

A method for irradiating a medium with a wave which is designed to focus on a particular portion in the medium, the method includes: irradiating the medium with an electromagnetic wave which is scattered in the medium, and is not designed to focus on the particular portion in the medium; detecting a first signal caused by irradiating the medium with the electromagnetic waver; irradiating the medium with a reconstructed wave which is designed to focus on the particular portion in the medium; detecting a second signal caused by irradiating the medium with the reconstructed wave; and monitoring, based on the first and second signals, that the particular portion is irradiated by the reconstructed wave.


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