The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Dec. 11, 2012
Applicant:
Olympus Corporation, Tokyo, JP;
Inventor:
Junichi Okada, Tokyo, JP;
Assignee:
OLYMPUS CORPORATION, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/36 (2006.01); H04N 7/18 (2006.01);
U.S. Cl.
CPC ...
G02B 21/008 (2013.01); G02B 21/002 (2013.01); G02B 21/365 (2013.01); H04N 7/18 (2013.01);
Abstract
Repeatability of control items is ensured by improving the precision of time control, and control details for the control items can be changed even when observation is underway. Provided is a laser-scanning microscope system including a microscope apparatus that scans a specimen surface with laser light from a laser light source by using a scanner; a hardware sequencer that controls the microscope apparatus so as to execute a control item that is set in an application program in correspondence with a time axis; and a software sequencer that manages control details for the control item that is set in the application program.