The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Aug. 12, 2011
Applicants:

Huibert Visser, Delft, NL;

Borgert Kruizinga, Delft, NL;

Michiel David Nijkerk, Delft, NL;

Inventors:

Huibert Visser, Delft, NL;

Borgert Kruizinga, Delft, NL;

Michiel David Nijkerk, Delft, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/28 (2006.01); G02B 13/12 (2006.01); G02B 17/06 (2006.01); G02B 23/06 (2006.01); G02B 13/08 (2006.01);
U.S. Cl.
CPC ...
G02B 13/12 (2013.01); G02B 17/0621 (2013.01); G02B 23/06 (2013.01); G02B 13/08 (2013.01);
Abstract

An anamorphotic telescope has mutually different magnification along directions of minimum and maximum magnification in an image plane. A spectroscope with an elongated input slit directed along one of the directions of maximum and minimum magnification may be located in the image plane. The anamorphotic telescope has a first and second reflector lens with mutually different first and second radii of curvature in directions (y, x) that optically correspond to directions of minimum and maximum magnification. At least one of the first and second reflector lens has a variable radius of curvature in one direction (x), which varies as a function of position in the other direction (y), the variable radius of curvature decreasing in a direction of the angle from the view direction to the light directed by the first reflector lens to the second reflector lens.


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