The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Mar. 22, 2013
Applicant:

Tdk Corporation, Tokyo, JP;

Inventor:

Robert Sutton, Cedar Park, TX (US);

Assignee:

TDK Corporation, Tokyo, JP;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 27/72 (2006.01); G01R 33/12 (2006.01); G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
G01R 33/12 (2013.01); G01R 31/001 (2013.01); G01R 31/006 (2013.01);
Abstract

A system, such as a magnetic immunity testing system, can include a first coil configured to generate a first magnetic field. The first coil can be disposed on a first side of a scanning volume and can have a first feed for supplying electric current to the first coil. A second coil can be similarly configured on an opposite side of a scanning volume, and a second magnetic field from the second coil can be combined with the first magnetic field to form a combined magnetic field. The coils can be provided with transporters that translate coils in at least one dimension. The system can also include a controller that is configured to control the transporters and the feeds to provide the combined magnetic field as a controlled and calibrated magnetic field over the scanning volume.


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