The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Jan. 08, 2013
Eaton Corporation, Cleveland, OH (US);
Xin Zhou, Franklin Park, PA (US);
Michael Dadian, Fletcher, NC (US);
Dale Gass, Brown Deer, WI (US);
Mark Gould, North Huntingdon, PA (US);
Edgar Perez Flores, Moon Township, PA (US);
Timothy Thompson, Pittsburgh, PA (US);
EATON CORPORATION, Cleveland, OH (US);
Abstract
A method of detecting and locating a micro-interface abnormality within an electrical system having a plurality of conductors and a plurality of electrical connections includes identifying a subset of the plurality of electrical connections by detecting an acoustic signal within the electrical system and analyzing the detected acoustic signal and determining that the detected acoustic signal is indicative of an electrical fault, measuring a contact resistance of each of the subset of the plurality of electrical connections, and identifying at least one of the subset of the plurality of electrical connection points as having a micro-interface abnormality based on the measured contact resistances.