The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Aug. 08, 2013
Applicant:

Brose Fahrzeugteile Gmbh & Co. Kg, Hallstadt, Hallstadt, DE;

Inventors:

Thomas Weingaertner, Memmelsdorf, DE;

Holger Wuerstlein, Zeil Am Main, DE;

Florian Pohl, Ebersdorf, DE;

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/26 (2006.01); B60R 25/20 (2013.01); H03K 17/955 (2006.01); E05F 15/46 (2015.01); E05F 15/73 (2015.01);
U.S. Cl.
CPC ...
G01R 27/2605 (2013.01); B60R 25/2054 (2013.01); H03K 17/955 (2013.01); E05F 15/46 (2015.01); E05F 15/73 (2015.01); E05Y 2400/852 (2013.01); E05Y 2400/858 (2013.01); E05Y 2900/50 (2013.01); E05Y 2900/546 (2013.01); H03K 2217/960715 (2013.01); H03K 2217/960725 (2013.01);
Abstract

A method measures a capacitance. According to the method, a first detection measurement for the capacitance which is to be measured is detected by a first measurement method during a first measurement phase. In this case, a second measurement phase is started when the first detection measurement satisfies a transition criterion. A second detection measurement for the capacitance which is to be measured is detected during the second measurement phase by a second measurement method which differs from the first measurement method. The second measurement method has higher measurement accuracy than the first measurement method but also greater energy expenditure.


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