The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

May. 29, 2012
Applicants:

Klaas Tack, Buggenhout, BE;

Andy Lambrechts, Herent, BE;

Luc Haspeslagh, Linden, BE;

Inventors:

Klaas Tack, Buggenhout, BE;

Andy Lambrechts, Herent, BE;

Luc Haspeslagh, Linden, BE;

Assignee:

IMEC, Leuven, BE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2011.01); G01J 3/26 (2006.01); G01J 3/28 (2006.01); G01J 3/12 (2006.01);
U.S. Cl.
CPC ...
G01J 3/26 (2013.01); G01J 3/2803 (2013.01); G01J 2003/1226 (2013.01);
Abstract

An integrated circuit for an imaging system is disclosed. In one aspect, an integrated circuit has an array of optical sensors, an array of optical filters integrated with the sensors and configured to pass a band of wavelengths onto one or more of the sensors, and read out circuitry to read out pixel values from the sensors to represent an image. Different ones of the optical filters are configured to have a different thickness, to pass different bands of wavelengths by means of interference, and to allow detection of a spectrum of wavelengths. The read out circuitry can enable multiple pixels under one optical filter to be read out in parallel. The thicknesses may vary non monotonically across the array. The read out, or later image processing, may involve selection or interpolation between wavelengths, to carry out spectral sampling or shifting, to compensate for thickness errors.


Find Patent Forward Citations

Loading…