The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 05, 2016
Filed:
Feb. 04, 2013
Applicant:
Texas Instruments Incorporated, Dallas, TX (US);
Inventors:
William C Wallace, Richardson, TX (US);
Alok Anand, Bangalore, IN;
Ravi Srivaths, IndiraNagar Bangalore, IN;
Chillara Kiran Kumar, Bangalore, IN;
Aruna Koityar, Bangalore, IN;
Assignee:
TEXAS INSTRUMENTS INCORPORATED, Dallas, TX (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01R 11/24 (2006.01); F41G 1/38 (2006.01); G05B 1/01 (2006.01); F41G 1/387 (2006.01); H01L 23/00 (2006.01);
U.S. Cl.
CPC ...
F41G 1/38 (2013.01); F41G 1/387 (2013.01); G05B 1/01 (2013.01); H01L 23/576 (2013.01); H01L 2924/0002 (2013.01); Y10T 29/49826 (2015.01);
Abstract
A system for detecting tamper events in a digital circuit by having a Critical Path Replica (CPR) circuit operable in parallel with the circuit being monitored, and adjusted to generate a timing violation if the operating parameters of the circuit change to be outside the normal operating parameters. The critical path replica circuit is adjusted to generate a timing violation before the actual circuit being monitored fails due to the changed operating parameters.