The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 05, 2016

Filed:

Aug. 18, 2011
Applicant:

Juan Manuel Teijido, Schliern, CH;

Inventor:

Juan Manuel Teijido, Schliern, CH;

Assignee:

HAAG-STREIT AG, Koeniz, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/00 (2006.01); A61B 3/13 (2006.01); A61B 3/135 (2006.01);
U.S. Cl.
CPC ...
A61B 3/14 (2013.01); A61B 3/0083 (2013.01); A61B 3/132 (2013.01); A61B 3/135 (2013.01);
Abstract

A device for stereoscopic examination of an eye, in particular a slit-lamp microscope, comprises, according to a first aspect of the invention, a lens for generating two images of the eye, wherein the device comprises at least one image sensor for electronic recording of the two images. According to a second aspect of the invention, the device for examination of an eye, in particular the slit-lamp microscope, comprises a lens for generating one image, wherein it comprises an image sensor for electronic recording of one image, and a viewing unit with an image-reproducing unit for presenting the image, and an eyepiece for viewing the image.


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