The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Dec. 20, 2011
Applicants:

Jens Nowotnick, Reutlingen, DE;

Walter Wagenbrenner, Tamm, DE;

Ulrich Warmbold, Hildesheim, DE;

Matthias Lausmann, Murr, DE;

Sven Heinemann, Braunschweig, DE;

Holger Gebhardt, Salzgitter, DE;

Bernhard Klante, Cremlingen, DE;

Inventors:

Jens Nowotnick, Reutlingen, DE;

Walter Wagenbrenner, Tamm, DE;

Ulrich Warmbold, Hildesheim, DE;

Matthias Lausmann, Murr, DE;

Sven Heinemann, Braunschweig, DE;

Holger Gebhardt, Salzgitter, DE;

Bernhard Klante, Cremlingen, DE;

Assignee:

Robert Bosch GmbH, Stuttgart, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05K 1/02 (2006.01); H05K 3/10 (2006.01); H05K 3/34 (2006.01); H05K 3/40 (2006.01);
U.S. Cl.
CPC ...
H05K 1/0268 (2013.01); H05K 3/10 (2013.01); H05K 3/3452 (2013.01); H05K 3/4007 (2013.01); H05K 2201/099 (2013.01); H05K 2203/0415 (2013.01); Y10T 29/49155 (2015.01);
Abstract

The invention relates to a printed circuit board (), with conductor tracks (), which are arranged at least on a surface of the printed circuit board () and serve for the electrical contacting of components, and with at least one testing zone (), which is formed by a portion of the conductor track () and serves for the electrical contacting of a testing element (), in particular a testing head, wherein the surface of the printed circuit board () is provided with a protective layer (), which is formed in the testing zone () such that it is interrupted in the region of a contact zone (), and wherein the contact zone () is provided with a layer (), which establishes an electrical contacting of the testing element () with the layer (). According to the invention, it is provided that the contact zone () is arranged at least partially at a lateral distance from the edges of the conductor track () in the region of the testing zone ().


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