The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Jun. 07, 2012
Applicants:
Sylvain Luiset, Fribourg, CH;
Matthew Thomas, Atlanta, GA (US);
Inventors:
Sylvain Luiset, Fribourg, CH;
Matthew Thomas, Atlanta, GA (US);
Assignee:
VERISIGN, INC., Reston, VA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 17/18 (2006.01); H04L 29/06 (2006.01); H04L 29/12 (2006.01);
U.S. Cl.
CPC ...
H04L 63/1441 (2013.01); H04L 61/103 (2013.01); H04L 61/1511 (2013.01); H04L 63/14 (2013.01); H04L 63/145 (2013.01); H04L 63/1408 (2013.01); H04L 63/16 (2013.01); H04L 2463/144 (2013.01);
Abstract
Methods and systems for detecting aberrant behavior in time-series observation data, such as non-existent domain data, are disclosed. The methods and systems analyze the time-series observation data to determine time-series prediction data. The time-series observation data and time-series prediction data are used to determine a threshold that is based on the standard deviation of deviation values between the time-series observation data and time-series prediction data. The threshold may be used to detect aberrant behavior in subsequently obtained time-series observation data.