The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Sep. 21, 2011
Masaki Umayabashi, Tokyo, JP;
Zhenlong Cui, Tokyo, JP;
Kazuo Takagi, Tokyo, JP;
NEC CORPORATION, Tokyo, JP;
Abstract
The present invention measures 1-way delay without equipping all nodes with special functionality in a situation in which time has not been synchronized. The delay measurement system of the present invention has a transmission origin node and a transmission destination node which is connected to the transmission origin node through a network including relay nodes, and measures the delay time from the transmission origin node to the transmission destination node direction, wherein the transmission origin node generates a clock. On the basis of the generated clock, delay measurement packets are generated at regular periods. The generated delay measurement packets are transmitted to the transmission destination node. The transmission destination node selects the delay measurement packets from among the received frames. The delay received by the delay measurement packets in the network between the transmission origin node to the node itself is measured.