The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Sep. 20, 2013
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Meiji Itoh, Kanagawa-ken, JP;

Yasunori Ohta, Kanagawa-ken, JP;

Akira Oosawa, Kanagawa-ken, JP;

Shoji Kanada, Kanagawa-ken, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06T 11/20 (2006.01);
U.S. Cl.
CPC ...
G06T 11/206 (2013.01);
Abstract

A test data obtaining unit for obtaining pieces of medical test data used to generate a plurality of graphs; a reference test data specifying unit for specifying reference test data from among the pieces of medical test data; a similarity calculation unit for calculating similarity of variation of each of pieces of non-reference test data other than the reference test data to variation of the reference test data; and a display control unit for selecting pieces of non-reference test data to be separately displayed from the pieces of non-reference test data based on the similarity of each non-reference test data, displaying non-reference graphs based on the pieces of non-reference test data to be separately displayed respectively on independent coordinate axes, and displaying non-reference graphs based on the pieces of non-reference test data that are not selected to be separately displayed together on the same coordinate axes are provided.


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