The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Aug. 25, 2011
Calibration apparatus, a distance measurement system, a calibration method and a calibration program
Shin Aoki, Kanagawa, JP;
Shin Aoki, Kanagawa, JP;
RICOH COMPANY, LTD., Tokyo, JP;
Abstract
A calibration apparatus is provided. The calibration apparatus receives inputs of two reference images and plural items of parallax data; searches for plural feature points common to these two reference images; calculates parallaxes and parallax changing amounts, based on the parallax data related to the respective feature points in these two reference images, for each of the searched feature points; and calculates a correction value for the parameter based on the calculated parallaxes and parallax changing amounts. The two reference images are captured by one of the imaging devices at two locations, and the parallax data is calculated using these two reference images and two corresponding images based on positions of plural feature points common to the reference image and the corresponding image for each pair on a location basis. The two corresponding images are captured by another of the imaging devices at these two locations.