The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Mar. 18, 2011
Takashi Yuasa, Sagamihara, JP;
Takashi Yuasa, Sagamihara, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
Provided is an optical tomographic imaging apparatus including: a unit for creating a measuring beam and a reference beam from beam of a light source, and generating interference light by combining a return beam resulting from the measuring beam and the reference beam; a unit for detecting the interference light to generate a detection signal; a unit for forming an image of the object based on the detection signal; a unit for designating a specific area in the image; a unit for setting a calculation index and a determination reference range used for determining image quality of the specific area; and a unit for applying calculation processing to a luminance value of the specific area based on the calculation index, determining whether a calculated value obtained as a result of the calculation processing is within the determination reference range, and outputting a detection result.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile