The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Apr. 18, 2012
Method and apparatus for inspecting countersinks using composite images from different light sources
Michael D. Mcgraw, Bonney Lake, WA (US);
Michael D. McGraw, Bonney Lake, WA (US);
The Boeing Company, Chicago, IL (US);
Abstract
Method and apparatus for measuring dimensionality of a component are disclosed herein. At least a first image may be collected from a first camera of an aperture or a first precision countersink of the component. The first camera may be in a first position and may operate in one or more luminance environments. At least a second image may be collected from a second camera of the aperture or a second precision countersink of the component. The second camera may be in a second position and may operate in an alternative lighting environment to differentiate characteristic features including hole and countersink against their intersection with the component. Positional and process refinement parameters may be calculated for, and provided to, one or more numerically controlled mechanisms, based on the collected first and second images.