The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
May. 31, 2013
Quanta Computer Inc., Tao Yuan Shien, TW;
Tien-Chin Fang, Taoyuan County, TW;
Jhen-Jhong Chen, Taoyuan County, TW;
Yao-Kun Lee, Taoyuan County, TW;
Chen-Chung Lee, Nantou County, TW;
Ping-Chi Lai, Taoyuan County, TW;
Ching-Shium Chen, New Taipei, TW;
QUANTA COMPUTER INC., Tao Yuan Shien, TW;
Abstract
An apparatus and a method for generating a bill of materials for inspection are disclosed. The apparatus for generating a bill of materials for inspection comprises a risk operation module, a data filtering module, and a data outputting module. The risk operation module selects a material risk index, a manufacturer risk index, a laboratory risk index corresponding to a material from the risk database, and decides the risk level according to the material risk index, the manufacturer risk index, and the laboratory risk index. The data filtering module determines whether a material needs to be inspected according to the risk level. The data outputting module selects a material sample from the material, and adds the material sample to the bill of materials for inspection.