The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Apr. 10, 2013
Fujitsu Limited, Kawasaki-shi, Kanagawa, JP;
Hiroaki Morikawa, Kawasaki, JP;
Tatsuya Asai, Kawasaki, JP;
Shinichiro Tago, Shinagawa, JP;
Takashi Katoh, Yokohama, JP;
Hiroya Inakoshi, Tama, JP;
Nobuhiro Yugami, Minato, JP;
FUJITSU LIMITED, Kawasaki, JP;
Abstract
A method for detecting an abnormal transition pattern from a transition pattern includes: first extracting an episode pattern with an appearance frequency greater than or equal to a first frequency from an episode pattern represented with a description form so as to include a first transition pattern and a second transition pattern differing in an order of a part of items from the first transition pattern to have a complementary relation thereto; second extracting a third transition pattern with an appearance frequency greater than or equal to a second frequency from the transition pattern; and specifying a transition pattern other than the third transition pattern from transition patterns included in the extracted episode pattern, and determining an abnormal transition pattern based on the transition pattern specified in the specifying when the third transition pattern includes a fourth transition pattern corresponding to the extracted episode pattern in the first extracting.