The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Oct. 29, 2010
Applicants:

Andrew Litvin, Stoneham, MA (US);

Sergey B. Simanovsky, Brookline, MA (US);

Ram C. Naidu, Newton, MA (US);

Inventors:

Andrew Litvin, Stoneham, MA (US);

Sergey B. Simanovsky, Brookline, MA (US);

Ram C. Naidu, Newton, MA (US);

Assignee:

ANALOGIC CORPORATION, Peabody, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01); G01V 5/00 (2006.01); G06K 9/52 (2006.01);
U.S. Cl.
CPC ...
G06K 9/46 (2013.01); G01V 5/0008 (2013.01); G06K 9/522 (2013.01); G06K 2209/09 (2013.01);
Abstract

One or more systems and/or techniques are provided to identify and/or classify objects of interest (e.g., potential granular objects) from a radiographic examination of the object. Image data of the object is transformed using a spectral transformation, such as a Fourier transformation, to generate image data in a spectral domain. Using the image data in the spectral domain, one or more one-dimensional spectral signatures can be generated and features of the signatures can be extracted and compared to features of one or more known objects. If one or more features of the signatures correspond (e.g., within a predetermined tolerance) to the features of a known object to which the feature(s) is compared, the object of interest may be identified and/or classified based upon the correspondence.


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