The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Mar. 27, 2012
Chetan Kumar Gupta, San Mateo, CA (US);
Song Wang, Mountain View, CA (US);
Abhay Mehta, Austin, TX (US);
MO Liu, San Jose, CA (US);
Elke Angelika Rundensteiner, Acton, MA (US);
Medhabi Ray, Worcester, MA (US);
Chetan Kumar Gupta, San Mateo, CA (US);
Song Wang, Mountain View, CA (US);
Abhay Mehta, Austin, TX (US);
Mo Liu, San Jose, CA (US);
Elke Angelika Rundensteiner, Acton, MA (US);
Medhabi Ray, Worcester, MA (US);
Hewlett Packard Enterprise Development LP, Houston, TX (US);
Abstract
A method of evaluating nested complex sequence pattern queries includes obtaining events from an event stream and evaluating the events within a first window using an outer query to produce outer partial results. The method also includes determining a more stringent window constraint, the more stringent window constraint comprising a subset of the window constraint corresponding to events that produces the outer partial results and passing the more stringent window constraint to an inner query nested within the outer query. A complex event processing system is also provided.