The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Dec. 20, 2013
Applicant:

Sandisk Enterprise Ip Llc, Milpitas, CA (US);

Inventors:

James Fitzpatrick, Sudbury, MA (US);

James Higgins, Chandler, AZ (US);

Assignee:

SANDISK ENTERPRISE IP LLC, Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/00 (2006.01); G11C 16/00 (2006.01); G06F 12/02 (2006.01); G11C 16/34 (2006.01);
U.S. Cl.
CPC ...
G06F 12/0246 (2013.01); G11C 16/3495 (2013.01);
Abstract

The various implementations described herein include systems, methods and/or devices used to enable biasing for wear leveling in storage systems. In one aspect, the method includes (1) determining, for each erase unit of a plurality of erase units in the storage medium, an age metric, (2) determining a representative age metric of the plurality of erase units, (3) for each respective erase unit of the plurality of erase units, biasing a respective garbage collection control metric for the respective erase unit in accordance with the age metric of the respective erase unit in relation to the representative age metric of the plurality of erase units to generate an adjusted garbage collection control metric for the respective erase unit, and (4) performing garbage collection for the storage medium in accordance with the adjusted garbage collection control metrics of the plurality of erase units.


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