The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Feb. 07, 2008
Applicants:

Rafael G. Cabezas, Austin, TX (US);

Anh T. Dang, Austin, TX (US);

Brandon D. Nelson, Austin, TX (US);

Inventors:

Rafael G. Cabezas, Austin, TX (US);

Anh T. Dang, Austin, TX (US);

Brandon D. Nelson, Austin, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 3/00 (2006.01); G06F 13/00 (2006.01); G06F 11/00 (2006.01); G06F 11/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/2221 (2013.01);
Abstract

The present invention provides a computer implemented method, data processing system and computer program product for running a diagnostic test on an I/O adapter. The data processing system communicates a stop command to a functional device driver; wherein the functional device driver is configured to communicate with the I/O adapter. The data processing system determines whether the functional device driver has completed storing a state of the I/O adapter. The data processing system loads a diagnostic device driver for communicating with the I/O adapter. The data processing system applies test inputs to the diagnostic device driver, wherein at least one test input is presented to the I/O adapter. The data processing system receives test results from the diagnostic device driver.


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