The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Aug. 06, 2013
Vmware, Inc., Palo Alto, CA (US);
Mazda A. Marvasti, Irvine, CA (US);
Arnak Poghosyan, Yerevan, AM;
Ashot Harutyunyan, Yerevan, AM;
Naira Grigoryan, Yerevan, AM;
VMware, Inc., Palo Alto, CA (US);
Abstract
This disclosure presents systems and methods for run-time analysis of streams of log data for abnormalities using a statistical structure of meta-data associated with the log data. The systems and methods convert a log data stream into meta-data and perform statistical analysis in order to reveal a dominant statistical pattern within the meta-data. The meta-data is represented as a graph with nodes that represent each of the different event types, which are detected in the stream along with event sources associated with the events. The systems and methods use real-time analysis to compare a portion of a current log data stream collected in an operational window with historically collected meta-data represented by a graph in order to determine the degree of abnormality of the current log data stream collected in the operational window.