The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Oct. 07, 2013
Applicant:

Washington University, St. Louis, MO (US);

Inventors:

Jung-Tsung Shen, St. Louis, MO (US);

Yuecheng Shen, St. Louis, MO (US);

Lihong Wang, St. Louis, MO (US);

Assignee:

WASHINGTON UNIVERSITY, St. Louis, MO (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/35 (2006.01); G01Q 60/22 (2010.01);
U.S. Cl.
CPC ...
G02F 1/3501 (2013.01); G01Q 60/22 (2013.01);
Abstract

A system for imaging an object is provided. The system includes a light source configured to emit light having a predetermined wavelength towards the object. The system further includes a metalens including a metallic film having a plurality of slits defined therethrough, the plurality of slits having a width a and a periodicity d that are both less than the predetermined wavelength, wherein the object is positioned between the light source and the metalens. The system further includes a detector configured to acquire measurements indicative of light transmitted through the metalens, and a computing device communicatively coupled to the detector and configured to reconstruct an image of the object based on the acquired measurements.


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