The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Feb. 13, 2012
Kurt A. Kramer, Port Richey, FL (US);
Peter R. Mouton, St. Petersburg, FL (US);
Lawrence O. Hall, Tampa, FL (US);
Dmitry Goldgof, Lutz, FL (US);
Daniel T. Elozory, Tampa, FL (US);
OM Pavithra Bonam, Wesley Chapel, FL (US);
Baishali Chaudhury, Tampa, FL (US);
Kurt A. Kramer, Port Richey, FL (US);
Peter R. Mouton, St. Petersburg, FL (US);
Lawrence O. Hall, Tampa, FL (US);
Dmitry Goldgof, Lutz, FL (US);
Daniel T. Elozory, Tampa, FL (US);
Om Pavithra Bonam, Wesley Chapel, FL (US);
Baishali Chaudhury, Tampa, FL (US);
UNIVERSITY OF SOUTH FLORIDA, Tampa, FL (US);
STEREOLOGY RESOURCE CENTER, INC., Chester, MD (US);
Abstract
Systems and methods are provided for automatic determination of slice thickness of an image stack in a computerized stereology system, as well as automatic quantification of biological objects of interest within an identified slice of the image stack. Top and bottom boundaries of a slice can be identified by applying a thresholded focus function to determine just-out-of-focus focal planes. Objects within an identified slice can be quantified by performing a color processing segmentation followed by a gray-level processing segmentation. The two segmentation processes generate unique identifiers for features in an image that can then be used to produce a count of the features.