The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Jul. 27, 2012
Applicants:

Michael Ganser, Giessen, DE;

Albrecht Weiss, Linden, DE;

Inventors:

Michael Ganser, Giessen, DE;

Albrecht Weiss, Linden, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/10 (2006.01); G02B 21/12 (2006.01); G02B 21/08 (2006.01); G02B 21/16 (2006.01); G02B 5/22 (2006.01);
U.S. Cl.
CPC ...
G02B 21/088 (2013.01); G02B 21/125 (2013.01); G02B 21/16 (2013.01); G02B 5/22 (2013.01);
Abstract

The invention relates to a microscope illumination method, to a microscope illumination set, comprising a white light LED () and a correction filter (), and to a corresponding microscope system () for analyzing a sample () alternately or simultaneously in transmitted light bright field illumination and in incident light fluorescence illumination, wherein a white light LED () is used for the transmitted light bright field illumination, and a correction filter () is activated at a location in the illumination beam path of the transmitted light bright field illumination both during transmitted light bright field illumination and during incident light fluorescence illumination, wherein the correction filter () has a spectral transmission profile which has a minimum in the wavelength range of at least one maximum of the spectrum of the white light LED ().


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