The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 9297991 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 29, 2016

Filed:

Feb. 25, 2013
Applicants:

The University of Tokyo, Tokyo, JP;

National University Corporation Shizuoka University, Shizuoka-shi, Shizuoka, JP;

Inventors:

Satoru Takahashi, Tokyo, JP;

Kiyoshi Takamasu, Musashino, JP;

Ryota Kudo, Minoh, JP;

Shin Usuki, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 26/00 (2006.01); G02B 21/06 (2006.01); G02B 21/26 (2006.01); G02F 1/01 (2006.01); G02B 21/14 (2006.01); G02B 27/60 (2006.01); G02B 27/58 (2006.01);
U.S. Cl.
CPC ...
G02B 21/06 (2013.01); G02B 21/14 (2013.01); G02B 21/26 (2013.01); G02F 1/01 (2013.01); G02B 27/58 (2013.01); G02B 27/60 (2013.01);
Abstract

Standing wave-generating planar wave illumination units generate two light-wave planar waves using light from a light source assembly and irradiate a sample surface with a standing wave produced by interference of the planar waves on the sample surface. A bias planar wave illumination unit generates a bias planar wave using light from the light source assembly and irradiates the sample surface with the wave. The bias planar wave is synchronized with the standing wave to alternately oscillate to positive and negative with an equal electric field displacement irrespective of the position on the sample surface across a reference time specified in advance when the displacement of the standing wave has a value '0' at the respective positions on the sample surface, and oscillates at a bias amplitude specified in advance to raise the displacement of the standing wave on the sample surface to only a positive or negative displacement.


Find Patent Forward Citations

Takahashi, Satoru. (2016). Lighting method and microscopic observation device (U.S. Patent No. 9297991). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9297991

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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