The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Oct. 04, 2013
Applicant:

Lightsmyth Technologies, Inc., Eugene, OR (US);

Inventors:

Christoph M. Greiner, Eugene, OR (US);

Thomas W. Mossberg, Eugene, OR (US);

Dmitri Iazikov, Eugene, OR (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 5/18 (2006.01); G02B 5/30 (2006.01);
U.S. Cl.
CPC ...
G02B 5/1861 (2013.01); G02B 5/1857 (2013.01); G02B 5/3058 (2013.01);
Abstract

A diffraction grating comprises a substrate with a set of protruding ridges and intervening trenches characterized by a ridge spacing Λ, width d, and height h. The substrate comprises a dielectric or semiconductor material with a refractive index n; the first substrate surface faces an optical medium with a refractive index nthat is less than n. Each ridge has a metal layer on its top surface of thickness t; at least a portion of the bottom surface of each trench is substantially free of metal. Over an operational wavelength range, λ/2n<Λ<λ/(n+n) can be satisfied. An optical signal can be incident on the diffractive elements from within the substrate at an incidence angle that exceeds the critical angle. The parameters n, n, Λ, d, h, and t can be selected to yield desired polarization dependence or independence of the diffraction efficiency.


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