The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Mar. 08, 2013
Freescale Semiconductor, Inc., Austin, TX (US);
Deyou Fang, Chandler, AZ (US);
Keith L. Kraver, Gilbert, AZ (US);
Heinz Loreck, Tempe, AZ (US);
Mike A. Margules, Austin, TX (US);
Mark E. Schlarmann, Chandler, AZ (US);
FREESCALE SEMICONDUCTOR INC., Austin, TX (US);
Abstract
Systems and methods are provided for monitoring operation of MEMS accelerometers (). In these embodiments a control loop () having a forward path () is coupled a MEMS transducer (), and a test signal generator () and test signal detector () is provided. The test signal generator () is configured to generate a test signal and apply the test signal to the forward path () of the control loop () during operation of the MEMS accelerometer transducer (). The test signal detector () is configured to receive an output signal from the control loop and detect the effects of the test signal in the output signal. Finally, the test signal detector () is further configured to generate a monitor output indicative of the operation of the sensing device to provide for the continuous monitoring of the operation of the MEMS accelerometer ().