The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Feb. 12, 2014
Mettler-toledo Ag, Greifensee, CH;
Christian Walter, Herrliberg, CH;
Félix Bécheiraz, Bülach, CH;
Manuela Gerber, Winterthur, CH;
Rolf Rohner, Volketswil, CH;
Mettler-Toledo GmbH, Greifensee, CH;
Abstract
A method and system for testing the functional capability of an analytical instrument uses first and second blind samples. Each blind sample is a test substance with an amount of a parameter to be tested that is unknown to the user. Each blind sample is provided with an identification means with a unique identification. When the blind samples are tested by the user in the instrument being tested, the measurement values obtained and the unique identifications read are compared against predetermined values that are accessible to a test program configured as software on the analytical instrument. By comparison of the measurement values and the predetermined values, the functional capability of the analytical instrument is determined and the result is transmitted to an output unit of the analytical instrument.