The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Apr. 18, 2013
Applicant:

Empire Technology Development Llc, Wilmington, DE (US);

Inventors:

Thomas A. Yager, Encinitas, CA (US);

Seth Adrian Miller, Englewood, CO (US);

Assignee:

Empire Technology Development LLC, Wilmington, DE (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/64 (2006.01); G01N 21/88 (2006.01); G01N 21/91 (2006.01); G01N 21/77 (2006.01); G01N 21/84 (2006.01); C09K 11/06 (2006.01);
U.S. Cl.
CPC ...
G01N 21/88 (2013.01); C09K 11/06 (2013.01); G01N 21/64 (2013.01); G01N 21/77 (2013.01); G01N 21/8422 (2013.01); G01N 21/91 (2013.01); C09K 2211/1011 (2013.01); G01N 2021/8433 (2013.01);
Abstract

Fluorophores or other indicators can be used to label and identify one or more defects in a graphene layer by localizing at the one or more defects and not at other areas of the graphene layer. A substrate having a surface at least partially covered by the graphene layer may be contacted with the fluorophore such that the fluorophore selectively binds with one or more areas of the surface of the underlying substrate exposed by the one or more defects. The one or more defects can be identified by exposing the substrate to radiation. A detected fluorescence response of the fluorophore to the radiation identifies the one or more defects.


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