The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Feb. 07, 2011
Applicants:

Jean-françois Guillemoles, Paris, FR;

Arnaud Etcheberry, Colombes, FR;

Isabelle Gerard, Gif sur Yvette, FR;

Pierre Tran-van, Courbevoie, FR;

Inventors:

Jean-François Guillemoles, Paris, FR;

Arnaud Etcheberry, Colombes, FR;

Isabelle Gerard, Gif sur Yvette, FR;

Pierre Tran-Van, Courbevoie, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01); G06F 19/00 (2011.01); G01N 21/64 (2006.01); G01N 21/47 (2006.01); H02S 50/10 (2014.01);
U.S. Cl.
CPC ...
G01N 21/6489 (2013.01); G01N 21/4738 (2013.01); H02S 50/10 (2014.12); G01N 2021/6493 (2013.01); G01N 2201/065 (2013.01);
Abstract

The invention relates to a method for determining the maximum open circuit voltage and the power that can be output by a photoconverter material subject to a measurement light intensity, the method including the following steps: measuring the photoluminescent intensity of the material, measuring the absorption rate of the photoconverter material at a second wavelength substantially equal to the photoluminescent wavelength of the photoconverter material, determining the maximum open circuit voltage of the photoconverter material with the measurement light intensity by means of the absorption rate and the photoluminescent intensity measured at substantially the same wavelength; said invention being characterized in that the light source and the photoconverter material are arranged such that the angular distributions of the rays incident on and emitted by the lit surface of the material and collected by the detector are substantially identical.


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