The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Mar. 12, 2012
Applicants:

Thomas Sahiri, Calabasas, CA (US);

Stefanie Greiffenreich, Neuenburg, DE;

Holm Kandler, Auggen, DE;

Christof Koltunski, Merzhausen, DE;

Inventors:

Thomas Sahiri, Calabasas, CA (US);

Stefanie Greiffenreich, Neuenburg, DE;

Holm Kandler, Auggen, DE;

Christof Koltunski, Merzhausen, DE;

Assignees:

Hellma Gmbh & Co., KG, Mullheim, DE;

Other;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/10 (2006.01); G01N 21/64 (2006.01); G01N 21/03 (2006.01); G01N 21/65 (2006.01); G01N 21/59 (2006.01);
U.S. Cl.
CPC ...
G01N 21/64 (2013.01); G01N 21/0303 (2013.01); G01N 21/59 (2013.01); G01N 21/645 (2013.01); G01N 21/65 (2013.01); G01N 2021/035 (2013.01);
Abstract

An apparatus () for analyzing, measuring the fluorescence, luminescence, phosphorescence, Raman scattering or absorption of a small amount, for example a drop, of a liquid sample () with the aid of light () which can be guided through the sample () and can then be detected or analyzed according to said measuring methods. Said apparatus comprises a sample holder which is at the top when in the position of use and has a receiving point () for applying or dripping the sample (), and a light inlet () for excitation light, said light inlet being horizontally oriented when in the position of use and below the sample holder (). The apparatus has a first device () which is downstream of the light inlet () in the beam path and is used to deflect the light upwards to a position to the side of the receiving point (), and second light deflection means () which guide the light beam coming from the bottom into the sample to be analyzed.


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