The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Apr. 04, 2013
Advanced Telecommunications Research Institute International, Soraku-gun, Kyoto, JP;
Takeaki Shimokawa, Soraku-gun, JP;
Takashi Kosaka, Soraku-gun, JP;
Okito Yamashita, Soraku-gun, JP;
Masaaki Sato, Soraku-gun, JP;
Abstract
In order to solve a problem that a local optical characteristic-changed region inside an object cannot be accurately estimated, an object observing apparatus includes: a light intensity information acquiring unit that acquires light intensity information received by each light-receiving probe; a light intensity change information acquiring unit that acquires, for each probe set, light intensity change information, from reference light intensity information and light intensity information; an estimating unit that acquires three-dimensional optical characteristic-changed region information, using the light intensity change information; and an output unit that outputs the optical characteristic-changed region information; the estimating unit including a correcting part that performs correction according to sensitivity attenuation in accordance with a depth; and a sparseness applying part that introduces sparseness for improving a space resolution, thereby acquiring the optical characteristic-changed region information. Accordingly, it is possible to accurately estimate a local optical characteristic-changed region inside an object.