The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Sep. 19, 2013
Applicant:

Seagate Technology Llc, Cupertino, CA (US);

Inventors:

Joachim Walter Ahner, Livermore, CA (US);

Samuel Kah Hean Wong, Johor Bahru, MY;

Maissarath Nassirou, Fremont, CA (US);

Henry Luis Lott, Fremont, CA (US);

David M. Tung, Livermore, CA (US);

Florin Zavaliche, San Ramon, CA (US);

Stephen Keith McLaurin, Sunnyvale, CA (US);

Assignee:

Seagate Technology LLC, Cupertino, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01); G01N 21/47 (2006.01); G01N 21/95 (2006.01);
U.S. Cl.
CPC ...
G01N 21/4738 (2013.01); G01N 21/95 (2013.01);
Abstract

Provided herein is an apparatus, including an optical characterization device; a photon detector array configured to sequentially receive a first set of photons scattered from surface features of an article and a second set of photons scattered from surface features of the article and subsequently processed by the optical characterization device; and a chemical characterization means for chemically characterizing the surface features of the article, wherein the chemical characterization means is configured for processing the first set of photons received by the photon detector array and the second set of photons received by the photon detector array.


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