The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Jan. 17, 2014
Applicant:
Michael Trainer, Coopersburg, PA (US);
Inventor:
Michael Trainer, Coopersburg, PA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/02 (2006.01); G01N 15/14 (2006.01); G01N 21/03 (2006.01);
U.S. Cl.
CPC ...
G01N 15/0211 (2013.01); G01N 15/0205 (2013.01); G01N 15/1459 (2013.01); G01N 21/0303 (2013.01); G01N 2015/1497 (2013.01);
Abstract
Method and apparatus are described for improving measurements of scattered light from particles by controlling multiple scattering and coincidence count levels. The scatter path in the particle dispersion and particle concentration are adjusted to reduce multiple scattering in ensemble particle scattering measurement. And the particle dispersion volume and particle concentration are adjusted to reduce coincidence counts in single particle scattering measurements. Alignment of the optical system, for measuring scattered light, is maintained by a reflection apparatus.