The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Feb. 28, 2011
Hirosuke Sugasawa, Kyoto, JP;
Hirosuke Sugasawa, Kyoto, JP;
HORIBA, LTD., , JP;
Abstract
To facilitate evaluation of a measurement condition in order to set an optimum measurement condition for each sample. A particle size distribution measuring device is provided with: an device main body that measures a particle size distribution of a sample; and an interface device that receives an input from an operator to perform drive control of the device main body, and receives a measurement result from the device main body to display the measurement result, wherein the interface device displays, in a graph, a relationship between values of operational parameters, which are to be set to measure the particle size distribution, and values of evaluation parameters obtained by using the measurement result from the device main body, which correspond to each of the values of the operational parameters.