The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Jan. 18, 2010
Atsushi Sakuma, Tokyo, JP;
Mitsuhiro Tani, Tokyo, JP;
Atsushi Sakuma, Tokyo, JP;
Mitsuhiro Tani, Tokyo, JP;
Abstract
A novel indentation test apparatus is provided. The indentation test apparatus is an apparatus for indenting a specimen with a spherical indenter. The indentation test apparatus includes a specimen thickness identifier) that identifies the thickness of the specimen, an equivalent indentation strain calculator that calculates equivalent indentation strain of the specimen by using the thickness of the specimen, and a Young's modulus calculator that calculates Young's modulus of the specimen by using the equivalent indentation strain. Young's modulus E of the specimen preferably ranges from 100 Pa to 100 MPa. The diameter of the spherical indenter preferably ranges from 1×10to 1 m.