The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Apr. 23, 2014
Applicant:

Voco Gmbh, Cuxhaven, DE;

Inventor:

Alexander Knüttel, Viernheim, DE;

Assignee:

Voco GmbH, Cuxhaven, DE;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/021 (2006.01); G01B 11/24 (2006.01); G01B 9/02 (2006.01); G03H 1/00 (2006.01); G01S 17/36 (2006.01); G01S 7/481 (2006.01); G03H 1/04 (2006.01); A61B 6/14 (2006.01); G01N 21/21 (2006.01); G01N 21/45 (2006.01); G02B 21/36 (2006.01); G02B 5/32 (2006.01); G03H 1/26 (2006.01); G03H 1/32 (2006.01); G03H 1/02 (2006.01);
U.S. Cl.
CPC ...
G01B 11/2441 (2013.01); G01B 9/02001 (2013.01); G01B 9/02007 (2013.01); G01B 9/02027 (2013.01); G01B 9/02032 (2013.01); G01B 9/02047 (2013.01); G01B 9/02067 (2013.01); G01S 7/4815 (2013.01); G01S 17/36 (2013.01); G03H 1/0005 (2013.01); G03H 1/0443 (2013.01); G03H 1/0465 (2013.01); G03H 1/0486 (2013.01); G03H 1/265 (2013.01); A61B 6/145 (2013.01); G01N 21/211 (2013.01); G01N 21/453 (2013.01); G01N 2021/213 (2013.01); G02B 5/32 (2013.01); G02B 21/367 (2013.01); G03H 1/2645 (2013.01); G03H 1/32 (2013.01); G03H 2001/0033 (2013.01); G03H 2001/0212 (2013.01); G03H 2001/046 (2013.01); G03H 2001/0445 (2013.01); G03H 2001/0491 (2013.01); G03H 2001/266 (2013.01); G03H 2210/63 (2013.01); G03H 2222/13 (2013.01); G03H 2222/16 (2013.01); G03H 2222/17 (2013.01); G03H 2222/31 (2013.01); G03H 2222/34 (2013.01); G03H 2222/35 (2013.01); G03H 2223/19 (2013.01); G03H 2223/22 (2013.01); G03H 2223/23 (2013.01);
Abstract

An apparatus for detecting a 3D structure of an object. The apparatus has first and second laser emitters which generate laser radiation having first and second wavelengths, respectively, the first wavelength being different from the second wavelength. Optical devices are disclosed, including a beam splitter, which splits the laser radiation of the laser emitters in each case into a reference radiation and an illuminating radiation. The illuminating radiation impinges upon the object to be measured, is reflected by the object as object radiation and interferes with the reference radiation. A detector receives the interference patterns. The laser emitters are located such that the illuminating radiation of the first and second laser emitters impinge upon the object at different angles of incidence. Also discussed is a measuring device which measures the two wavelengths of the laser radiation of the laser emitters and influences the recording of the interference patterns.


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