The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 29, 2016

Filed:

Dec. 11, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Ethan E. Cruz, LaGrangeville, NY (US);

Michael W. Harper, Round Rock, TX (US);

Ryan M. Kruse, Round Rock, TX (US);

Arden L. Moore, Cedar Park, TX (US);

Brian G. Veraa, Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/74 (2006.01); B42D 25/36 (2014.01); G06K 9/00 (2006.01); B42D 25/20 (2014.01);
U.S. Cl.
CPC ...
B42D 25/36 (2014.10); B42D 25/20 (2014.10); G06K 9/00046 (2013.01);
Abstract

An anti-counterfeiting technique presents, to a test thermoreflective mark at a first temperature, a first electromagnetic wave. A first test reflective profile for the test thermoreflective mark associated with the first temperature is recorded. A second electromagnetic wave is presented to the test thermoreflective mark at a second temperature. A second test reflective profile for the test thermoreflective mark associated with the second temperature is recorded. The first test reflective profile is compared with a first control reflective profile that is associated with a genuine thermoreflective mark. The second test reflective profile is compared with a second control reflective profile that is associated with the genuine thermoreflective mark.


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