The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Mar. 13, 2014
Jeffrey A. Ketterling, New York, NY (US);
Jonathan Mamou, New York, NY (US);
Ronald H. Silverman, New York, NY (US);
Jerry Sebag, Laguna Beach, CA (US);
Jeffrey A. Ketterling, New York, NY (US);
Jonathan Mamou, New York, NY (US);
Ronald H. Silverman, New York, NY (US);
Jerry Sebag, Laguna Beach, CA (US);
Riverside Research Institute, New York, NY (US);
The Trustees of Columbia University in the City of New York, New York, NY (US);
Abstract
A quantitative method to analyze phase-resolved, raw backscatter echo data or the envelope of phase-resolved, raw backscatter echo data to characterize vitreous inhomogeneities as they relate to normal aging and vitreo-retinal disease. The technique can be applied to 2D or 3D data acquired from the vitreous. The approach provides an objective end value to characterize the vitreous and provide a tool for early diagnosis, monitoring and planning treatment of vitreo-retinal diseases.