The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Feb. 18, 2013
Applicant:
Koninklijke Philips N.v., Eindhoven, NL;
Inventors:
Alfonso Agatino Isola, Eindhoven, NL;
Eberhard Sebastian Hansis, Hamburg, DE;
Jens Wiegert, Aachen, DE;
Assignee:
KONINKLIJKE PHILIPS N.V., Eindhoven, NL;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); A61B 6/00 (2006.01); A61B 6/03 (2006.01); G06T 7/00 (2006.01); G06T 5/00 (2006.01); G06K 9/46 (2006.01); G06K 9/62 (2006.01); G06T 7/20 (2006.01); G06T 11/00 (2006.01); G06K 9/52 (2006.01); G01V 3/00 (2006.01); H04N 9/78 (2006.01);
U.S. Cl.
CPC ...
A61B 6/5264 (2013.01); A61B 6/032 (2013.01); A61B 6/46 (2013.01); A61B 6/5211 (2013.01); G06K 9/46 (2013.01); G06K 9/4604 (2013.01); G06K 9/52 (2013.01); G06K 9/6215 (2013.01); G06K 9/6267 (2013.01); G06T 5/00 (2013.01); G06T 7/0012 (2013.01); G06T 7/0081 (2013.01); G06T 7/2033 (2013.01); G06T 11/008 (2013.01); G06K 2009/4666 (2013.01); G06T 2207/10081 (2013.01); G06T 2207/20141 (2013.01); G06T 2207/20182 (2013.01); G06T 2207/20201 (2013.01); G06T 2207/30008 (2013.01);
Abstract
A method and system for reducing localized artifacts in imaging data, such as motion artifacts and bone streak artifacts, are provided. The method includes segmenting the imaging data to identify one or more suspect regions in the imaging data near which localized artifacts are expected to occur, defining an artifact-containing region of interest in the imaging data around each suspect region, and applying a local bias field within the artifact-containing regions to correct for the localized artifacts.