The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 29, 2016
Filed:
Dec. 08, 2011
Warren R. Zipfel, Ithaca, NY (US);
Rebecca M. Williams, Ithaca, NY (US);
Warren R. Zipfel, Ithaca, NY (US);
Rebecca M. Williams, Ithaca, NY (US);
CORNELL UNIVERSITY, Ithaca, NY (US);
Abstract
A microscope apparatus and a microscopic method that uses the microscope apparatus for examining a sample or a specimen, such as but not limited to a tissue sample or a tissue specimen, includes a convex curved distal exit window at a distal end of the microscope apparatus. Due to the presence of the convex curved distal exit window, the microscope apparatus may readily make contact with the sample or the specimen absent trauma to the sample or the specimen. In addition, an index of refraction matched immersion fluid may be used for focusing the microscope apparatus by hydraulic movement of an objective optic lens assembly interior to the distal exit window with respect to the distal exit window. The convex curved distal exit window and index of refraction matched immersion fluid characteristics may be extended to various microscope apparatuses and methods, and in particular medical microscope apparatuses and methods.